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Please use this identifier to cite or link to this item: http://hdl.handle.net/2005/1202

Title: Statistical Modeling Of Transistor Mismatch Effects In 100nm CMOS Devices
Authors: Srinivasaiah, H C
Advisors: Bhat, Navakanta
Keywords: Complimentary Metal Oxide Semiconductor Devices
CMOS Devices
Transistor Mismatch
Submitted Date: Jul-2004
Series/Report no.: G18591
Abstract file URL: http://etd.ncsi.iisc.ernet.in/abstracts/1563/G18591-Abs.pdf
URI: http://etd.iisc.ernet.in/handle/2005/1202
Appears in Collections:Electrical Communication Engineering (ece)

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