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Please use this identifier to cite or link to this item: http://hdl.handle.net/2005/1464

Title: "Phase-Correlation Based Displacemnt-Metrology" - Few Investigations
Authors: Diwan, C Yogesh
Advisors: Rao, L Kameswara
Keywords: Phase Correlation - Metrology
Phase Measuring Instruments
Micro-object Dimensions - Measurement
Optical Metrology
Transparent Plates - Refractive Index - Measurement
Diffraction Fringes - Measurement
Gaussian Laser Beams
Fourier Phase Shift Method (FPS)
Refractive Index
Submitted Date: Jul-2005
Series/Report no.: G19148
Abstract file URL: http://etd.ncsi.iisc.ernet.in/abstracts/1883/G19148-Abs.pdf
URI: http://etd.iisc.ernet.in/handle/2005/1464
Appears in Collections:Instrumentation and Applied Physics (iap)

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