etd AT Indian Institute of Science: Interference Enhanced Raman Spectroscopy Of Ultra Thin Crystalline Ge & Si Films And Their Interfaces

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etd AT Indian Institute of Science >
Division of Physical and Mathematical Sciences >
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Please use this identifier to cite or link to this item: http://hdl.handle.net/2005/1763

Title:	Interference Enhanced Raman Spectroscopy Of Ultra Thin Crystalline Ge & Si Films And Their Interfaces
Authors:	Kanakaraju, S
Advisors:	Mohan, S Sood, A K
Keywords:	Semiconductor Films Thin Films - Raman Spectroscopy Raman Spectroscopy Ge Films Si Films
Submitted Date:	May-1997
Series/Report no.:	G14904
Abstract file URL:	http://etd.ncsi.iisc.ernet.in/abstracts/2289/G14904-Abs.pdf
URI:	http://hdl.handle.net/2005/1763
Appears in Collections:	Instrumentation and Applied Physics (iap)

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