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Please use this identifier to cite or link to this item: http://hdl.handle.net/2005/1763

Title: Interference Enhanced Raman Spectroscopy Of Ultra Thin Crystalline Ge & Si Films And Their Interfaces
Authors: Kanakaraju, S
Advisors: Mohan, S
Sood, A K
Keywords: Semiconductor Films
Thin Films - Raman Spectroscopy
Raman Spectroscopy
Ge Films
Si Films
Submitted Date: May-1997
Series/Report no.: G14904
Abstract file URL: http://etd.ncsi.iisc.ernet.in/abstracts/2289/G14904-Abs.pdf
URI: http://hdl.handle.net/2005/1763
Appears in Collections:Instrumentation (isu)

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